What is the Difference Between SEM and TEM?
🆚 Go to Comparative Table 🆚The main difference between Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) lies in the way they create images of samples. SEM detects reflected or knocked-off electrons, while TEM uses transmitted electrons (electrons that pass through the sample) to create an image. Here are some key differences between the two techniques:
- Image Type: SEM produces topographical or surface images, while TEM provides images of the internal structure of the sample.
- Resolution: TEM has a higher resolution compared to SEM, with magnification up to 50,000,000 times, while SEM has a magnification of up to 2,000,000 times.
- Sample Interaction: In SEM, a fine, focused beam of electrons scans the surface of the sample, interacting with it to generate secondary electrons, backscattered electrons, and X-rays, which are then used to create a magnified image. In TEM, a broad beam of electrons is transmitted through the sample, creating an image that details the sample's morphology, composition, and crystal structure.
- Sample Preparation: TEM requires more intensive sample preparation and user training compared to SEM.
- Applications: Choose TEM if you want information on the inner structure of a sample, such as crystal structure, morphology, or stress state information. Choose SEM if you require information on the sample's surface and its composition.
Both SEM and TEM are valuable tools in various fields, including biomedical research, forensics, and technology. However, they are more suitable for different purposes, and the choice between them depends on the specific information you want to obtain from your sample.
Comparative Table: SEM vs TEM
Here is a table summarizing the main differences between Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM):
| Feature | SEM | TEM |
|---|---|---|
| Type of electrons | Scattered, scanning electrons | Transmitted electrons |
| High tension | ~1–30 kV | ~60–300 kV |
| Specimen thickness | Any | Typically <150 nm |
| Type of information | 3D image of surface | 2D projection image of inner structure |
The main difference between SEM and TEM is that SEM creates an image by detecting reflected electrons, while TEM uses transmitted electrons (electrons that pass through the sample) to create an image. As a result, TEM offers valuable information on the inner structure of the sample, such as crystal structure, morphology, and stress state information, while SEM provides information on the sample's surface and its composition.
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